Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Kaupp, Gerd
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2006
Θέματα:	Nanotechnology Engineering Physical optics Biochemistry Chemistry, Physical organic Life sciences Chemistry Physics and Applied Physics in Engineering Applied Optics, Optoelectronics, Optical Devices Βιοχημεία Physical Chemistry Life Sciences, general
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-3-540-28472-7

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