Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

• Κύριος συγγραφέας: Kaupp, Gerd
• Μορφή: Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2006
• Θέματα: Nanotechnology; Engineering; Physical optics; Biochemistry; Chemistry, Physical organic; Life sciences; Chemistry; Physics and Applied Physics in Engineering; Applied Optics, Optoelectronics, Optical Devices; Βιοχημεία; Physical Chemistry; Life Sciences, general