Built-in test for VLSI: preudorandom techniques

Built-in test for VLSI: preudorandom techniques

Bibliographic Details
Main Authors:	Bardell, Paul H. (Author), McAnney, William H. (Author), Savir, Jacob (Author)
Format:	Book
Language:	English
Published:	New York John Wiley & Sons c1987
Subjects:	INTEGRATED CIRCUITS VLSI

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